Products

Hardness Measurement Automation Systems
Motion Control and Geometry Dimension Measurement Systems
Remote Data Transmission and Control Systems
Semiconductor Wafer Testing Analysis Systems
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Portable Brinell Hardness Indentation Measurement System (iVision_HB)

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Micro/Vickers Hardness Measurement System (iVision_HV)

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USB Stepping Motors Motion Control and Driver Board (iMotion_USCD)

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XY Motorized Sample Stage (iMotion_XYMS Compact)

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Geometry Measurement Software (iVision_PM)

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Gear Measurement Software (iVision_GM)

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Composition Analysis Software (iVision_CA)

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Grain Size Measurement Software (iVision_GR)

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Image Stitching and Extended Focal Imaging Software (iVision_CP)

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TCP/IP Control Board (iControl_TCPGC)

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Bitmap PatRec

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WaferTest PatRec

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Defect Density PatRec

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